Transmission electron microscope on the Titan TEM platform.
Next generation microscopy with the possibility of combination S / TEM, which becomes a powerful analyzer for materials science - analysis of chemical bonding and composites, 3D imaging, S / TEM tomography, dynamic analysis, in situ analysis of gas-solid samples.
It has a resolution at the atomic level.
Presence of a heated table, which helps to analyze mixtures of components with different morphology and structure.