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Home / Products / Electron Microscopy / Transmission Electron Spectroscopy (TEM) / Spectra S/TEM Series for materials and semiconductors analysis

Spectra S/TEM Series for materials and semiconductors analysis

Spectra S / TEM series covers a group of microscopes applicable to the analysis of various materials and semiconductors.

 

Spectra Ultra TEM has the capabilities of a combined scanning and transmission microscope - S / TEM.

 

Spectra 200 and Spectra 300 TEM are available in TEM and STEM variants тоо.

 

 

The energy range of the system depends on how it is configured, as the measurement in a given range is done with one measurement


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