Nexsa G2 Surface Analysis System

Nexsa G2 Surface Analysis System photoelectron spectrometer is fully automated and combines different analysis techniques. It contains a new type, micro-focused source, which achieves better sensitivity and higher resolution.

The system allows a Raman spectrometer to be integrated into it for complete, correlative analysis of surfaces.

With all these options and capabilities, the Nexsa G2 Surface Analysis System photoelectron spectrometer enables new discoveries in semiconductors, 2D materials, thin films, batteries, polymers and many other applications.

The standard configuration includes:

• Newly designed X-ray source;
• Patented dual-beam electron and ion source;
• EX06 ion source.

Analytical options:

• UV photoelectron spectroscopy;
• Ion scattering spectroscopy;
• Spectroscopy with loss of reflected ionic energy;
• Raman spectroscopy; MAGCIS ion source for dual mode operation;
• ARXPS rotating module;
• Vacuum transfer module.