|
Evolution One |
Evolution One Plus |
Evolution Pro |
Optical design |
Double beam |
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Spectral bandwidth |
1.0 nm |
1.0 nm; 2.0 nm |
0.5 nm; 1.0 nm; 1.5 nm; 2.0 nm; 4.0 nm |
Source |
xenon |
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Detector |
Dual silicon photodiode |
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Spectral range |
190 -1100 nm |
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Wavelength accuracy |
0.8 nm full range |
0.3 nm |
|
Wavelength repeatability |
≤ 0.05 nm |
< 0.05 nm |
|
Scan speed |
< 1 to 6000 nm/min |
Till 6000 nm/min |
|
Data interval |
0.1; 0.2; 0.5; 1; 2; 5; 10 nm |
0.05; 0.1; 0.2; 0.5; 1; 2; 5; 10 nm |
|
Photometric range |
>3.5 А |
> 4А |
|
Photometric accuracy |
± 0.004 А at 1 А; ± 0.008 А at 2 А |
± 0.004 А at 1 А; |
|
Photometric accuracy |
± 0.0002 А |
± 0.0025 А |
|
Photometric noise |
≤ 0.00015 А at 0А; ≤0.00010 at 1А; ≤0.00025 at 2А |
< 0.00018 А at 0А; <0.00022 at 1А; <0.00050 at 2А |
|
Drift |
< 0.0005 А/hour |
||
Stray light |
≤ 1%Т at 198 nm; ≤ 0.05%T at 220 nm; |
2.4 A at 198 nm; |
|
Baseline flatness |
± 0.0006 А |
± 0.0015 А |